AUSTIN, Texas--(BUSINESS WIRE)-- NI (NASDAQ: NATI) today announced the acquisition of SET GmbH (“SET”), long-standing experts in aerospace and defense test system development and recent innovators in ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

Semiconductor aging refers to the slow loss of electrical characteristics of the semiconductor device as a result of continuous use or prolonged exposure to various environmental conditions like ...

Heterogeneous integration is driving innovation in the semiconductor industry, but it also introduces more complexity in chip design, which translates to more intricate test requirements. The ...

The chip industry is looking to AI and data analytics to improve yield, operational efficiency, and reduce the overall cost of designing and manufacturing complex devices. In fact, SEMI estimates its ...

Technology/device testing and certification service providers including Sporton International, Audix and BTL as well as semiconductor material, reliability and failure analysis service providers such ...

FREMONT, CA / ACCESSWIRE / July 16, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it entered into a stock purchase agreement ...

Download the full guide from Pickering to discover our five key reasons why reed relays are ideal for semiconductor testing, plus recommended products for your application. Aug. 27, 2025 Semiconductor ...

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...

The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...